Simple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips

Hui-Wen Cheng; Yuan-Chih Chang; Chi-Tsu Yuan; Song-Nien Tang; Chia-Seng Chang; Jau Tang; Fu-Rong Chen; Rong-Long Pan; Fan-Gang Tseng

doi:10.1021/jp401050t

Simple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips

Hui-Wen Cheng, Yuan-Chih Chang, Chi-Tsu Yuan, Song-Nien Tang, Chia-Seng Chang, Jau Tang, Fu-Rong Chen, Rong-Long Pan, Fan-Gang Tseng^*

^*Corresponding author for this work

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

8 Citations (Scopus)

Abstract

This paper introduces a simple, yet controllable scheme to pick up a single 13 nm Au nanoparticle (Au-NP) using the tip of an atomic force microscope (AFM) probe through the application of electrical biases between the tip and the Au-NP. Transmission electron microscope (TEM) images were acquired to verify that a single Au-NP was attached to the AFM probe. We postulate that the mechanism underlying the ability to manipulate individual Au-NPs at the apex of the AFM probe tip is Coulomb interaction induced by tip bias. The AFM tip with the attached Au-NP was then used to study the interaction between a single quantum dot (QD) and the Au-NP. The blinking behavior of single colloidal CdSe/ZnS core/shell QD was significantly suppressed with the approach of the 13 nm Au-NP attached to the AFM tip.

Original language	English
Pages (from-to)	13239-13246
Journal	The Journal of Physical Chemistry C
Volume	117
Issue number	25
Online published	7 Jun 2013
DOIs	https://doi.org/10.1021/jp401050t
Publication status	Published - 27 Jun 2013
Externally published	Yes

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@article{fd16de9cd44c43329022b1b64b816b26,

title = "Simple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips",

abstract = "This paper introduces a simple, yet controllable scheme to pick up a single 13 nm Au nanoparticle (Au-NP) using the tip of an atomic force microscope (AFM) probe through the application of electrical biases between the tip and the Au-NP. Transmission electron microscope (TEM) images were acquired to verify that a single Au-NP was attached to the AFM probe. We postulate that the mechanism underlying the ability to manipulate individual Au-NPs at the apex of the AFM probe tip is Coulomb interaction induced by tip bias. The AFM tip with the attached Au-NP was then used to study the interaction between a single quantum dot (QD) and the Au-NP. The blinking behavior of single colloidal CdSe/ZnS core/shell QD was significantly suppressed with the approach of the 13 nm Au-NP attached to the AFM tip.",

author = "Hui-Wen Cheng and Yuan-Chih Chang and Chi-Tsu Yuan and Song-Nien Tang and Chia-Seng Chang and Jau Tang and Fu-Rong Chen and Rong-Long Pan and Fan-Gang Tseng",

year = "2013",

month = jun,

day = "27",

doi = "10.1021/jp401050t",

language = "English",

volume = "117",

pages = "13239--13246",

journal = "The Journal of Physical Chemistry C",

issn = "1932-7447",

publisher = "American Chemical Society",

number = "25",

}

TY - JOUR

T1 - Simple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips

AU - Cheng, Hui-Wen

AU - Chang, Yuan-Chih

AU - Yuan, Chi-Tsu

AU - Tang, Song-Nien

AU - Chang, Chia-Seng

AU - Tang, Jau

AU - Chen, Fu-Rong

AU - Pan, Rong-Long

AU - Tseng, Fan-Gang

PY - 2013/6/27

Y1 - 2013/6/27

N2 - This paper introduces a simple, yet controllable scheme to pick up a single 13 nm Au nanoparticle (Au-NP) using the tip of an atomic force microscope (AFM) probe through the application of electrical biases between the tip and the Au-NP. Transmission electron microscope (TEM) images were acquired to verify that a single Au-NP was attached to the AFM probe. We postulate that the mechanism underlying the ability to manipulate individual Au-NPs at the apex of the AFM probe tip is Coulomb interaction induced by tip bias. The AFM tip with the attached Au-NP was then used to study the interaction between a single quantum dot (QD) and the Au-NP. The blinking behavior of single colloidal CdSe/ZnS core/shell QD was significantly suppressed with the approach of the 13 nm Au-NP attached to the AFM tip.

AB - This paper introduces a simple, yet controllable scheme to pick up a single 13 nm Au nanoparticle (Au-NP) using the tip of an atomic force microscope (AFM) probe through the application of electrical biases between the tip and the Au-NP. Transmission electron microscope (TEM) images were acquired to verify that a single Au-NP was attached to the AFM probe. We postulate that the mechanism underlying the ability to manipulate individual Au-NPs at the apex of the AFM probe tip is Coulomb interaction induced by tip bias. The AFM tip with the attached Au-NP was then used to study the interaction between a single quantum dot (QD) and the Au-NP. The blinking behavior of single colloidal CdSe/ZnS core/shell QD was significantly suppressed with the approach of the 13 nm Au-NP attached to the AFM tip.

UR - http://www.scopus.com/inward/record.url?scp=84879667666&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-84879667666&origin=recordpage

U2 - 10.1021/jp401050t

DO - 10.1021/jp401050t

M3 - RGC 21 - Publication in refereed journal

SN - 1932-7447

VL - 117

SP - 13239

EP - 13246

JO - The Journal of Physical Chemistry C

JF - The Journal of Physical Chemistry C

IS - 25

ER -

Simple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips

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