Silicon carbide formation by methane plasma immersion ion implantation into silicon
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 1375-1379 |
Journal / Publication | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 21 |
Issue number | 4 |
Publication status | Published - Jul 2003 |
Link(s)
Abstract
Methane plasma immersion ion implantation into silicon was used for the synthesis of silicon carbide films. The molecular ions were found to dissociate upon entry into the sample surface. The films underwent a transformation from hydrogenated amorphous silicon carbide to β-SiC with increasing annealing temperature.
Citation Format(s)
Silicon carbide formation by methane plasma immersion ion implantation into silicon. / An, Zhenghua; Fu, Ricky K.Y.; Chen, Peng et al.
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 21, No. 4, 07.2003, p. 1375-1379.
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 21, No. 4, 07.2003, p. 1375-1379.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review