Sieve estimation of semiparametric accelerated mean models with panel count data

Xiangbin Hu, Wen Su, Xingqiu Zhao

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Abstract

A widely adopted semiparametric model for analyzing panel count data is a proportional mean model, which may be deemed inappropriate when the proportionality assumption is violated. Motivated by the popular accelerated failure time model that relaxes such assumption, we investigate accelerated mean models for semiparametric regression analysis of panel count data. For estimation of bundled parameters, we develop a sieve least squares estimation procedure, which is robust in the sense that no distributional assumption is required for the underlying recurrent event process. Overcoming the theoretical challenges from bundled parameters, we establish the consistency and convergence rate of the proposed estimators, and derive the asymptotic normality of both the finite-dimensional estimator and the functionals of the infinite-dimensional estimator. Simulation studies demonstrate promising performances of the proposed approach, and an application to a skin cancer chemoprevention trial yields some new findings. © 2023, Institute of Mathematical Statistics. All rights reserved.
Original languageEnglish
Pages (from-to)1316-1343
JournalElectronic Journal of Statistics
Volume17
Issue number1
Online published1 Jan 2023
DOIs
Publication statusPublished - Jan 2023
Externally publishedYes

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 3 - Good Health and Well-being
    SDG 3 Good Health and Well-being

Research Keywords

  • Accelerated mean model
  • counting process
  • empirical process
  • panel count data
  • sieve least squares estimation

Publisher's Copyright Statement

  • This full text is made available under CC-BY 4.0. https://creativecommons.org/licenses/by/4.0/

RGC Funding Information

  • RGC-funded

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