Sequential inspection under capacity constraints

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)410-421
Journal / PublicationOperations Research
Volume47
Issue number3
Publication statusPublished - May 1999
Externally publishedYes

Abstract

We study the inspection process in the context of multistage batch manufacturing, focusing on interstage coordination under capacity limits. The problem is formulated as a constrained Markov decision program. We establish the optimality of a sequential policy that is characterized by a sequence of thresholds, with certain randomization at the thresholds. We further show that such an optimal policy can be completely derived through solving a linear program, and that randomization is needed at no more than two threshold values. We discuss an application in semiconductor wafer fabrication, which motivates our study.

Citation Format(s)

Sequential inspection under capacity constraints. / Yao, David D.; Zheng, Shaohui.

In: Operations Research, Vol. 47, No. 3, 05.1999, p. 410-421.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review