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Separation by plasma implantation of oxygen (SPIMOX) operational phase space

  • S. Sundar Kumar Iyer
  • , Xiang Lu
  • , Jingbao Liu
  • , Jing Min
  • , Zhineng Fan
  • , Paul K. Chu
  • , Chenming Hu
  • , Nathan W. Cheung

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Abstract

    Separation by plasma implantation of oxygen (SPIMOX) has been suggested as an economic alternative for separation by implantation of oxygen (SIMOX) to form the silicon-oninsulator (SOI) structure. The chief advantage of SPIMOX is the high throughput and low-cost implanter. The operation regime of implantation for SPIMOX, which uses dc plasma immersion ion implantation (PHI) for the oxygen implantation, has been studied in the phase space of implantation time and chamber pressure during implantation. The phase space is developed for a definite implantation voltage and dose which are dependent on the dimensions of the SOI structure to be fabricated. The effects of dose, implantation voltage, and fractional ionization on the phase space have been discussed. SPIMOX can achieve high throughputs for thin-SOI structure fabrications using high fractional ionization plasmas. The phase space developed for SPIMOX implantation can also be used for other high-dose dc implantations with PHI which require a peaked implant profile below the surface. © 1997 IEEE.
    Original languageEnglish
    Pages (from-to)1128-1135
    JournalIEEE Transactions on Plasma Science
    Volume25
    Issue number5
    DOIs
    Publication statusPublished - 1997

    Research Keywords

    • PHI
    • Plasma processing
    • Silicon on insulator
    • SIMOX
    • SOI
    • SPIMOX

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