Separating the recrystallization and deformation texture components by high-energy X-rays

Y. D. Wang, X. L. Wang, A. D. Stoica, J. D. Almer, U. Lienert, D. R. Haeffner

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

12 Citations (Scopus)

Abstract

High-energy synchrotron diffraction offers great potential for experimental study of recrystallization kinetics. Measurements on partially recrystallized samples using a monochromatic high-energy synchrotron beam show that recrystallized grains generate sharp diffraction spots, whereas the intensity from the deformed matrix varies smoothly along the Debye-Scherrer rings. Based on these observations, a method has been developed to separate the recrystallization texture components from those originating from the deformation matrix. The validity of this method is demonstrated with partially recrystallized interstitial-free steel. © 2002 International Union of Crystallography.
Original languageEnglish
Pages (from-to)684-688
JournalJournal of Applied Crystallography
Volume35
Issue number6
DOIs
Publication statusPublished - Dec 2002
Externally publishedYes

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