Semi-supervised classification based on random subspace dimensionality reduction
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 1119-1135 |
Journal / Publication | Pattern Recognition |
Volume | 45 |
Issue number | 3 |
Online published | 30 Aug 2011 |
Publication status | Published - Mar 2012 |
Externally published | Yes |
Link(s)
Abstract
Graph structure is vital to graph based semi-supervised learning. However, the problem of constructing a graph that reflects the underlying data distribution has been seldom investigated in semi-supervised learning, especially for high dimensional data. In this paper, we focus on graph construction for semi-supervised learning and propose a novel method called Semi-Supervised Classification based on Random Subspace Dimensionality Reduction, SSC-RSDR in short. Different from traditional methods that perform graph-based dimensionality reduction and classification in the original space, SSC-RSDR performs these tasks in subspaces. More specifically, SSC-RSDR generates several random subspaces of the original space and applies graph-based semi-supervised dimensionality reduction in these random subspaces. It then constructs graphs in these processed random subspaces and trains semi-supervised classifiers on the graphs. Finally, it combines the resulting base classifiers into an ensemble classifier. Experimental results on face recognition tasks demonstrate that SSC-RSDR not only has superior recognition performance with respect to competitive methods, but also is robust against a wide range of values of input parameters.
Research Area(s)
- Graph construction, Semi-supervised classification, Random subspaces, Dimensionality reduction, Ensembles of classifiers, FACE RECOGNITION, FRAMEWORK
Citation Format(s)
In: Pattern Recognition, Vol. 45, No. 3, 03.2012, p. 1119-1135.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review