Abstract
We study semiparametric regression for a recurrent event process with an informative terminal event, where observations are taken only at discrete time points, rather than continuously over time. To account for the effect of a terminal event on the recurrent event process, we propose a semiparametric reversed mean model, for which we develop a two-stage sieve likelihood-based method to estimate the baseline mean function and the covariate effects. Our approach overcomes the computational difficulties arising from the nuisance functional parameter in the assumption that the likelihood is based on a Poisson process. We establish the consistency, convergence rate, and asymptotic normality of the proposed twostage estimator, which is robust against the assumption of an underlying Poisson process. The proposed method is evaluated using extensive simulation studies, and demonstrated using panel count data from a longitudinal healthy longevity study and data from a bladder tumor study.
| Original language | English |
|---|---|
| Pages (from-to) | 1843-1862 |
| Number of pages | 20 |
| Journal | Statistica Sinica |
| Volume | 34 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - Oct 2024 |
| Externally published | Yes |
Funding
The authors would like to thank the Editor, the Associate Editor and the two reviewers for their constructive and insightful comments and suggestions that greatly improved the paper. This research was supported in part by the Research Grant Council of Hong Kong (15301218, 17308420), the Natural Science Foundation of China (12271459, 12171374), and National Institutes of Health of USA (U54GM115458).
Research Keywords
- Counting process
- expected log-likelihood
- reversed mean model
- semiparametric M-estimator
- terminal event
RGC Funding Information
- RGC-funded
Fingerprint
Dive into the research topics of 'Semiparametric reversed mean models for recurrent event processes with informative terminal events'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver