Abstract
Electromigration in a two-phase structure is considered and analyzed. Concentration gradient is not a driving force of diffusion in this case and does not oppose the segregation. The microstructure instability is due to the lack of chemical-potential gradient to counteract the electric field. No steady state of composition gradient will take place. Instead, random local states of phase separation precede a complete phase separation. Kinetic analysis of flux migration in two-phase structure under the constraint of constant volume is given.
| Original language | English |
|---|---|
| Pages (from-to) | 487-493 |
| Journal | Metallofizika i Noveishie Tekhnologii |
| Volume | 31 |
| Issue number | 4 |
| Publication status | Published - 2009 |
| Externally published | Yes |
Bibliographical note
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