Schottky contacts of Gd-Pt and Gd-V alloys on n-Si and p-Si
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 6763-6768 |
Journal / Publication | Journal of Applied Physics |
Volume | 52 |
Issue number | 11 |
Publication status | Published - 1981 |
Externally published | Yes |
Link(s)
Abstract
Alloys of Gd-Pt and Gd-V, both Gd-rich and Pt or V-rich, have been prepared by coevaporation onto n- and p-type Si for Schottky contact formation. Structural and electrical properties of these contacts after various heat treatments have been studied by combining x-ray diffraction, backscattering spectroscopy, and current-voltage measurement. We found that these alloys produced a mixture of silicides on Si; i.e., they formed parallel contacts of GdSi2 and PtSi or GdSi2 and VSi2 to Si. We also found that the sum of apparent Schottky barrier heights of these parallel contacts on n-Si and p-Si is not necessarily equal to the value of the band gap of Si, which we recall is always true for a single phase contact.
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Citation Format(s)
Schottky contacts of Gd-Pt and Gd-V alloys on n-Si and p-Si. / Thompson, R.; Eizenberg, M.; Tu, K. N.
In: Journal of Applied Physics, Vol. 52, No. 11, 1981, p. 6763-6768.
In: Journal of Applied Physics, Vol. 52, No. 11, 1981, p. 6763-6768.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review