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Scalable fabrication of mid-wavelength and long-wavelength infrared photodetectors based on narrow bandgap semiconductors: challenges and opportunities

  • Jong Hun Moon
  • , Sanghyun Nam
  • , Sion Kim
  • , Jiajia Zha
  • , Chaoliang Tan*
  • , Hyungjin Kim*
  • *Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

2 Downloads (CityUHK Scholars)

Abstract

Mid-wavelength infrared (MWIR) and long-wavelength infrared (LWIR) detectors, which operate within the 3–14 μm wavelength range, have been extensively employed in various fields, including military, space exploration, environmental monitoring, biomedicine, and chemical analysis. While thermal detectors are commonly used, their limitations in sensitivity and response time render them less suitable for next-generation MWIR and LWIR applications. These advanced applications necessitate the use of narrow bandgap semiconductor-based photodetectors, which offer tunable optoelectronic properties and higher specific detectivity compared to thermal detectors. In this review, we provide a detailed analysis of the operational principles and manufacturing strategies of infrared photodetectors based on narrow bandgap semiconductors, which enable high-performance detection in the MWIR and LWIR regions. Our focus is specifically on scalable fabrication of MWIR and LWIR photodetectors, emphasizing devices with active areas ranging from millimeters to centimeters. Researches on large-scale fabrication of infrared photodetectors using quantum dots, two-dimensional (2D) van der Waals (vdW) materials, and three-dimensional (3D) bulk semiconductors are investigated. Finally, we summarize the remaining challenges in developing scalable narrow bandgap semiconductor-based MWIR and LWIR photodetectors for commercialization. By addressing the obstacles such as the difficulty in large-scale unform film synthesis, the requirement for cryogenic device operation, and the introduction of high-density of defect states during the hybridization processes, MWIR and LWIR photodetectors based on narrow bandgap semiconductors will pave the way for designing new sensory systems and applications in a wavelength regime that has been less developed compared to the visible and near-infrared (NIR) ranges. © 2025 The Author(s). Published by IOP Publishing Ltd on behalf of the IMMT.
Original languageEnglish
Article number012012
Number of pages43
JournalInternational Journal of Extreme Manufacturing
Volume8
Issue number1
Online published22 Oct 2025
DOIs
Publication statusPublished - Feb 2026

Funding

This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2022R1C1C100923512) and by the Yonsei University Research Fund of 2023-22-0076. H.K. was supported by the POSCO Science Fellowship from POSCO TJ Park Foundation. This paper was the result of the research project supported by SK hynix Inc.

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 9 - Industry, Innovation, and Infrastructure
    SDG 9 Industry, Innovation, and Infrastructure

Research Keywords

  • barrier-type
  • long-wavelength infrared
  • mid-wavelength infrared
  • photoconductive
  • photodetectors
  • photovoltaic

Publisher's Copyright Statement

  • This full text is made available under CC-BY 4.0. https://creativecommons.org/licenses/by/4.0/

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