Sample refinement and manipulation of silicon nanowires: A step towards single wire characterization

J. Z. He; J. B. Xu; Z. Xie; M. F. Chiah; N. Ke; W. Y. Cheung; I. H. Wilson; X. L. Ma; Y. H. Tang; N. Wang; C. S. Lee; S. T. Lee

doi:10.1016/S1044-5803(02)00233-4

Sample refinement and manipulation of silicon nanowires: A step towards single wire characterization

J. Z. He, J. B. Xu, Z. Xie, M. F. Chiah, N. Ke, W. Y. Cheung, I. H. Wilson, X. L. Ma, Y. H. Tang, N. Wang, C. S. Lee, S. T. Lee

Centre of Super-Diamond and Advanced Films

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

3 Citations (Scopus)

Abstract

Refined silicon nanowires have been prepared by a mild etching process and suspended into liquid in order to make them manageable for individual characterization. A transmission electron microscopy (TEM) study has revealed that the etching starts selectively at defect sites on the wires. This implies that the refined wires have many fewer defects than those made of raw materials. Efforts have been made to mount single nanowires onto the desired electrodes by electrophoresis. Compared with the commonly used microactuation method in the field, this is a far more realistic practical use of the wires that has an industrial value. © 2002 Published by Elsevier Science Inc.

Original language	English
Pages (from-to)	177-181
Journal	Materials Characterization
Volume	48
Issue number	2-3
DOIs	https://doi.org/10.1016/S1044-5803(02)00233-4
Publication status	Published - Apr 2002

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@article{bb415209643d4fd080e44504da214c9a,

title = "Sample refinement and manipulation of silicon nanowires: A step towards single wire characterization",

abstract = "Refined silicon nanowires have been prepared by a mild etching process and suspended into liquid in order to make them manageable for individual characterization. A transmission electron microscopy (TEM) study has revealed that the etching starts selectively at defect sites on the wires. This implies that the refined wires have many fewer defects than those made of raw materials. Efforts have been made to mount single nanowires onto the desired electrodes by electrophoresis. Compared with the commonly used microactuation method in the field, this is a far more realistic practical use of the wires that has an industrial value. {\textcopyright} 2002 Published by Elsevier Science Inc.",

author = "He, {J. Z.} and Xu, {J. B.} and Z. Xie and Chiah, {M. F.} and N. Ke and Cheung, {W. Y.} and Wilson, {I. H.} and Ma, {X. L.} and Tang, {Y. H.} and N. Wang and Lee, {C. S.} and Lee, {S. T.}",

year = "2002",

month = apr,

doi = "10.1016/S1044-5803(02)00233-4",

language = "English",

volume = "48",

pages = "177--181",

journal = "Materials Characterization",

issn = "1044-5803",

publisher = "Elsevier Inc.",

number = "2-3",

}

TY - JOUR

T1 - Sample refinement and manipulation of silicon nanowires

T2 - A step towards single wire characterization

AU - He, J. Z.

AU - Xu, J. B.

AU - Xie, Z.

AU - Chiah, M. F.

AU - Ke, N.

AU - Cheung, W. Y.

AU - Wilson, I. H.

AU - Ma, X. L.

AU - Tang, Y. H.

AU - Wang, N.

AU - Lee, C. S.

AU - Lee, S. T.

PY - 2002/4

Y1 - 2002/4

N2 - Refined silicon nanowires have been prepared by a mild etching process and suspended into liquid in order to make them manageable for individual characterization. A transmission electron microscopy (TEM) study has revealed that the etching starts selectively at defect sites on the wires. This implies that the refined wires have many fewer defects than those made of raw materials. Efforts have been made to mount single nanowires onto the desired electrodes by electrophoresis. Compared with the commonly used microactuation method in the field, this is a far more realistic practical use of the wires that has an industrial value. © 2002 Published by Elsevier Science Inc.

AB - Refined silicon nanowires have been prepared by a mild etching process and suspended into liquid in order to make them manageable for individual characterization. A transmission electron microscopy (TEM) study has revealed that the etching starts selectively at defect sites on the wires. This implies that the refined wires have many fewer defects than those made of raw materials. Efforts have been made to mount single nanowires onto the desired electrodes by electrophoresis. Compared with the commonly used microactuation method in the field, this is a far more realistic practical use of the wires that has an industrial value. © 2002 Published by Elsevier Science Inc.

UR - http://www.scopus.com/inward/record.url?scp=0036526519&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0036526519&origin=recordpage

U2 - 10.1016/S1044-5803(02)00233-4

DO - 10.1016/S1044-5803(02)00233-4

M3 - RGC 21 - Publication in refereed journal

SN - 1044-5803

VL - 48

SP - 177

EP - 181

JO - Materials Characterization

JF - Materials Characterization

IS - 2-3

ER -

Sample refinement and manipulation of silicon nanowires: A step towards single wire characterization

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