Rough sets based reasoning and pattern mining for a two-stage information filtering system
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Author(s)
Detail(s)
Original language | English |
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Title of host publication | International Conference on Information and Knowledge Management, Proceedings |
Pages | 1429-1432 |
Publication status | Published - 2010 |
Externally published | Yes |
Conference
Title | 19th International Conference on Information and Knowledge Management and Co-located Workshops, CIKM'10 |
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Place | Canada |
City | Toronto, ON |
Period | 26 - 30 October 2010 |
Link(s)
Abstract
This paper presents a novel two-stage information filtering model which combines the merits of term-based and pattern-based approaches to effectively filter sheer volume of information. In particular, the first filtering stage is supported by a novel rough analysis model which efficiently removes a large number of irrelevant documents, thereby addressing the overload problem. The second filtering stage is empowered by a semantically rich pattern taxonomy mining model which effectively fetches incoming documents according to the specific information needs of a user, thereby addressing the mismatch problem. The experimental results based on the RCV1 corpus show that the proposed two-stage filtering model significantly outperforms other types of "two-stage" information filtering models. © 2010 ACM.
Research Area(s)
- Decision, Experimentation, Theory
Citation Format(s)
Rough sets based reasoning and pattern mining for a two-stage information filtering system. / Zhou, Xujuan; Li, Yuefeng; Bruza, Peter et al.
International Conference on Information and Knowledge Management, Proceedings. 2010. p. 1429-1432.
International Conference on Information and Knowledge Management, Proceedings. 2010. p. 1429-1432.
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review