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Robustness of various production control policies in semiconductor manufacturing

Houmin Yan, Sheldon Lou, Suresh P. Sethi

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

This paper compares several different production control policies in terms of their robustness to random disturbances such as machine failures, demand fluctuations, and system parameter changes. Simulation models based on VLSI wafer fabrication facilities are utilized to test the performance of the policies. Three different criteria, namely, the average total WIP, the average backlog, and a cost function combining these measures, are used to evaluate performance. Among the policies tested, the Two-Boundary Control policy outperforms the others. © 2000 The Authors.
Original languageEnglish
Pages (from-to)171-182
JournalProduction and Operations Management
Volume9
Issue number2
DOIs
Publication statusPublished - Jun 2000
Externally publishedYes

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 9 - Industry, Innovation, and Infrastructure
    SDG 9 Industry, Innovation, and Infrastructure

Research Keywords

  • Kanban
  • Push and pull production policies
  • Re-entrant shop
  • Simulation
  • Two-boundary control

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