Robustness of synchronization in coupled Chua's circuits

G. Q. Zhong*, K. T. Ko, K. F. Man

*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

3 Citations (Scopus)

Abstract

This paper addresses the robustness in synchronization by perturbating the system parameters. Both mutually and unidirectionally coupled Chua's circuits have been used for this investigation. The results obtained from numerical computation have been found that the coupled systems is in its most robust form when the state variable x only is used for coupling, whereas the state variable z is found to be otherwise. This paper reports a thorough investigation into the effectiveness of the parametric variations and a number of critical regions have been defined for the classification of the chaos within the context of synchronization. © 1998 IEEE
Original languageEnglish
Title of host publicationIEEE International Symposium on Industrial Electronics Proceedings
Subtitle of host publicationISIE’98
PublisherIEEE
Pages436-440
Volume2
ISBN (Print)0-7803-4756-0
DOIs
Publication statusPublished - Jul 1998
Event1998 International Symposium on Industrial Electronics (ISIE 1998) - University of Pretoria, Pretoria, South Africa
Duration: 7 Jul 199810 Jul 1998

Conference

Conference1998 International Symposium on Industrial Electronics (ISIE 1998)
PlaceSouth Africa
CityPretoria
Period7/07/9810/07/98

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