Robustness of symmetric X charts to nonnormality and control-limit estimation

Huifen Chen, Yuyen Cheng, David Goldsman, Kwok-Leung Tsui, Bruce W. Schmeiser

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

1 Citation (Scopus)

Abstract

We study the mean and variance of the run length of the X-chart as a function of the underlying distribution skewness and kurtosis (indicators of nonnormality) and the number n of Phase-I data points for estimating the control limits. Our results show that the nonnormality has significant and nonmonotonic effects on the X-chart performance. Our analytical and simulation results show that (1) the mean and variance of the run length decrease in n; (2) the in-control mean run length is infinity for all bounded distributions whenever the control limits are two or more estimated standard deviations from the known mean; and (3) for unbounded distributions, using n ≥500 Phase-I data points provides run-length distributions close to those obtained with known control limits.
Original languageEnglish
Title of host publicationProceedings - 14th ISSAT International Conference on Reliability and Quality in Design
Pages94-99
Publication statusPublished - 2008
Externally publishedYes
Event14th ISSAT International Conference on Reliability and Quality in Design - Orlando, FL, United States
Duration: 7 Aug 20089 Aug 2008

Conference

Conference14th ISSAT International Conference on Reliability and Quality in Design
PlaceUnited States
CityOrlando, FL
Period7/08/089/08/08

Research Keywords

  • Average run length
  • Bounded distribution
  • Johnson distribution
  • Kurtosis
  • Skewness

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