Robust control for Itô stochastic systems with Markovian switching via sliding mode design
Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with host publication) › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the World Congress on Intelligent Control and Automation (WCICA) |
| Pages | 239-242 |
| Volume | 1 |
| Publication status | Published - 2006 |
Publication series
| Name | |
|---|---|
| Volume | 1 |
Conference
| Title | 6th World Congress on Intelligent Control and Automation, WCICA 2006 |
|---|---|
| Place | China |
| City | Dalian |
| Period | 21 - 23 June 2006 |
Link(s)
Abstract
In this talk, the control problem of uncertain Itô stochastic systems with Markovian switching has been dealt with. A sliding mode control method is presented, in which the integral-type sliding function is utilized. By means of stochastic Lyapunov function, sufficient conditions via linear matrix inequalities (LMIs) with equality constraint are derived such that the sliding dynamics are stochastically stable with γ-disturbance attenuation. Moreover, the reachability of the specified sliding surface can be ensured. Especially, the designs of both sliding mode controller and sliding surface can be obtain via convex optimization. © 2006 IEEE.
Research Area(s)
- Itô stochastic systems, Markovian switching, Sliding mode control, Uncertainties
Citation Format(s)
Robust control for Itô stochastic systems with Markovian switching via sliding mode design. / Ho, Daniel W. C.; Niu, Yugang.
Proceedings of the World Congress on Intelligent Control and Automation (WCICA). Vol. 1 2006. p. 239-242 1712308.
Proceedings of the World Congress on Intelligent Control and Automation (WCICA). Vol. 1 2006. p. 239-242 1712308.
Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with host publication) › peer-review
