Robust and area-efficient nLDMOS-SCR with waffle layout structure for high-voltage ESD protection

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Engineering & Materials Science

Research OutputsResearch Output authored by Robust and area-efficient nLDMOS-SCR with waffle layout structure for high-voltage ESD protection is tagged with the concept