Revisiting the Impact of Concept Drift on Just-in-Time Quality Assurance
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
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Title of host publication | Proceedings 2020 IEEE 20th International Conference on Software Quality, Reliability, and Security |
Subtitle of host publication | QRS 2020 |
Publisher | Institute of Electrical and Electronics Engineers, Inc. |
Pages | 53-59 |
ISBN (electronic) | 9781728189130 |
ISBN (print) | 9781728189147 |
Publication status | Published - Dec 2020 |
Publication series
Name | Proceedings - IEEE International Conference on Software Quality, Reliability, and Security, QRS |
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Conference
Title | 20th IEEE International Conference on Software Quality, Reliability, and Security (QRS 2020) |
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Location | Zoom meetings |
Place | China |
City | Macau |
Period | 11 - 14 December 2020 |
Link(s)
Abstract
The performance of software defect prediction(SDP) models is known to be dependent on the datasets used for training the models. Evolving data in a dynamic software development environment such as significant refactoring and organizational changes introduces new concept to the prediction model, thus making improved classification performance difficult. In this study, we investigate and assess the existence and impact of concept drift on SDP performances. We empirically asses the prediction performance of five models by conducting cross-version experiments using fifty-five releases of five open-source projects. Prediction performance fluctuated as the training datasets changed over time. Our results indicate that the quality and the reliability of defect prediction models fluctuate over time and that this instability should be considered by software quality teams when using historical datasets. The performance of a static predictor constructed with data from historical versions may degrade over time due to the challenges posed by concept drift. ©2020 IEEE.
Research Area(s)
- Concept drift, Defect prediction, Just-in-Time Quality assurance
Citation Format(s)
Revisiting the Impact of Concept Drift on Just-in-Time Quality Assurance. / Bennin, Kwabena E.; Ali, Nauman bin; Börstler, Jürgen et al.
Proceedings 2020 IEEE 20th International Conference on Software Quality, Reliability, and Security: QRS 2020. Institute of Electrical and Electronics Engineers, Inc., 2020. p. 53-59 9282807 (Proceedings - IEEE International Conference on Software Quality, Reliability, and Security, QRS).
Proceedings 2020 IEEE 20th International Conference on Software Quality, Reliability, and Security: QRS 2020. Institute of Electrical and Electronics Engineers, Inc., 2020. p. 53-59 9282807 (Proceedings - IEEE International Conference on Software Quality, Reliability, and Security, QRS).
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review