Response to "Comment on 'Effect of current crowding on vacancy diffusion and void formation in electromigration'" [Appl. Phys. Lett. 79, 1061 (2001)]

K. N. Tu*

*Corresponding author for this work

Research output: Journal Publications and ReviewsComment/debate

8 Citations (Scopus)
Original languageEnglish
Pages (from-to)1063
JournalApplied Physics Letters
Volume79
Issue number7
DOIs
Publication statusPublished - 13 Aug 2001
Externally publishedYes

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