Resonant Raman scattering in ZnO:Mn and ZnO:Mn : Al thin films grown by RF sputtering

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

24 Scopus Citations
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Author(s)

  • M. F. Cerqueira
  • M. I. Vasilevskiy
  • F. Oliveira
  • A. G. Rolo
  • T. Viseu
  • And 3 others
  • J. Ayres De Campos
  • E. Alves
  • R. Correia

Detail(s)

Original languageEnglish
Article number334205
Journal / PublicationJournal of Physics Condensed Matter
Volume23
Issue number33
Publication statusPublished - 24 Aug 2011
Externally publishedYes

Abstract

Raman spectroscopy results obtained under visible (non-resonant) and UV (resonant) excitation for nanocrystalline ZnO, ZnO:Mn and ZnO:Mn:Al thin films grown by radio frequency magnetron sputtering are presented and compared. The origin of the multiple longitudinal optical (LO) phonon Raman peaks, strongly enhanced under resonance conditions, and the effects of the dopants on them are discussed in the framework of the 'cascade' model. It is suggested that the observed suppression of the higher-order LO phonon lines for ZnO:Mn:Al is caused by the dissociation of excitons in the heavily n-type doped material. On the basis of the cascade model interpretation of the higher-order Raman peaks in the resonant spectra, the LO phonon frequencies for wavevectors away from the Γ point are evaluated and compared to previously published phonon dispersion curves. © 2011 IOP Publishing Ltd.

Citation Format(s)

Resonant Raman scattering in ZnO:Mn and ZnO:Mn : Al thin films grown by RF sputtering. / Cerqueira, M. F.; Vasilevskiy, M. I.; Oliveira, F.; Rolo, A. G.; Viseu, T.; Ayres De Campos, J.; Alves, E.; Correia, R.

In: Journal of Physics Condensed Matter, Vol. 23, No. 33, 334205, 24.08.2011.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review