Resistance Distances In Simplicial Networks
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
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Detail(s)
Original language | English |
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Article number | bxac052 |
Pages (from-to) | 1922–1935 |
Number of pages | 14 |
Journal / Publication | Computer Journal |
Volume | 66 |
Issue number | 8 |
Online published | 23 Apr 2022 |
Publication status | Published - Aug 2023 |
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Abstract
It is well known that in many real networks, such as brain networks and scientific collaboration networks, there exist higher order nonpairwise relations among nodes, i.e. interactions between more than two nodes at a time. This simplicial structure can be described by simplicial complexes and has an important effect on topological and dynamical properties of networks involving such group interactions. In this paper, we study analytically resistance distances in iteratively growing networks with higher order interactions characterized by the simplicial structure that is controlled by a parameter q. We derive exact formulas for interesting quantities about resistance distances, including Kirchhoff index, additive degree-Kirchhoff index, multiplicative degree-Kirchhoff index, as well as average resistance distance, which have found applications in various areas elsewhere. We show that the average resistance distance tends to a q-dependent constant, indicating the impact of simplicial organization on the structural robustness measured by average resistance distance.
Research Area(s)
- Effective resistance, Kirchhoff index, simplicial network, simplicial complex, higher order organization, scale-free network, KEMENYS CONSTANT, CONSENSUS, COHERENCE, DYNAMICS, GRAPHS
Citation Format(s)
Resistance Distances In Simplicial Networks. / ZHU, Mingzhe; XU, Wanyue; ZHANG, Zhongzhi et al.
In: Computer Journal, Vol. 66, No. 8, bxac052, 08.2023, p. 1922–1935.
In: Computer Journal, Vol. 66, No. 8, bxac052, 08.2023, p. 1922–1935.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review