Residual-based pattern center calibration in high-resolution electron backscatter diffraction
- Hongru Zhong
- , Qiwei Shi*
- , Zhe Chen*
- , Chengyi Dan
- , Shengyi Zhong
- , Haowei Wang
*Corresponding author for this work
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
11
Link opens in a new tab
Citations
(Scopus)