Abstract
Quality variations in manufacturing are the root causes for product high infant failure rate. A structural model of quality variations in manufacturing composed of part-level, component-level and system-level is put forward firstly. Then the bi-variant Gumbel Copula for positive correlation quantification is tailored to obtain the correlation dependence of the three levelled variations, and the impact of the structural but correlated quality variations on product infant failure rate is conducted systematically under Weibull distribution. Finally, a case study is carried out to verify the proposed method.
| Original language | English |
|---|---|
| Title of host publication | 2015 IEEE International Conference on Industrial Engineering and Engineering Management |
| Publisher | IEEE Computer Society |
| Pages | 792-796 |
| ISBN (Electronic) | 9781467380652 |
| ISBN (Print) | 9781467380669, 9781467380676 |
| DOIs | |
| Publication status | Published - 7 Dec 2015 |
| Event | 2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2015) - SUNTEC Convention Centre, Singapore, Singapore Duration: 6 Dec 2015 → 9 Dec 2015 http://www.meetmatt.net/ieem2015/docs/IEEM%202015%20Program%20Book.pdf http://www.IEEM.org |
Conference
| Conference | 2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2015) |
|---|---|
| Abbreviated title | IEEM 2015 |
| Place | Singapore |
| City | Singapore |
| Period | 6/12/15 → 9/12/15 |
| Internet address |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 9 Industry, Innovation, and Infrastructure
Research Keywords
- Gumbel Copula
- Infant failure rate
- quality variations
- structural model
- Weibull distribution
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