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Reply to comment on `Modelling of trap-assisted electronic conduction in thin thermally nitrided oxide films' by P. Pipinys and V. Lapeika

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

Hei Wong comments on the argument of P. Pipinys and V. Lapeika on modeling of trap-assisted electronic conduction in thin thermally nitrided oxide films. He argues that the temperature dependencies of the current conduction in nitrided oxides can be very complicated. Phonon-assisted tunneling of electrons from deeps traps is one but not the unique and the predominating process. Instead, shallow traps should play a very important role in the current conduction in nitrided oxides.
Original languageEnglish
Pages (from-to)1967-1968
JournalSolid-State Electronics
Volume43
Issue number10
DOIs
Publication statusPublished - 1999

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