Abstract
Hei Wong comments on the argument of P. Pipinys and V. Lapeika on modeling of trap-assisted electronic conduction in thin thermally nitrided oxide films. He argues that the temperature dependencies of the current conduction in nitrided oxides can be very complicated. Phonon-assisted tunneling of electrons from deeps traps is one but not the unique and the predominating process. Instead, shallow traps should play a very important role in the current conduction in nitrided oxides.
| Original language | English |
|---|---|
| Pages (from-to) | 1967-1968 |
| Journal | Solid-State Electronics |
| Volume | 43 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 1999 |
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