Reliability Enhancement Through Optimal Burn-In

Way Kuo

doi:10.1109/TR.1984.5221760

Reliability Enhancement Through Optimal Burn-In

Way Kuo

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Original language	English
Pages (from-to)	145-156
Journal	IEEE Transactions on Reliability
Volume	R-33
Issue number	2
DOIs	https://doi.org/10.1109/TR.1984.5221760
Publication status	Published - Jun 1984
Externally published	Yes

Research Keywords

Burn-in Weibull distribution
Generalized Reduced Gradient (GRG) Method
keywords
Optimization

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10.1109/TR.1984.5221760

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title = "Reliability Enhancement Through Optimal Burn-In",

keywords = "Burn-in Weibull distribution, Generalized Reduced Gradient (GRG) Method, keywords, Optimization",

author = "Way Kuo",

year = "1984",

month = jun,

doi = "10.1109/TR.1984.5221760",

language = "English",

volume = "R-33",

pages = "145--156",

journal = "IEEE Transactions on Reliability",

issn = "0018-9529",

publisher = "IEEE",

number = "2",

}

TY - JOUR

T1 - Reliability Enhancement Through Optimal Burn-In

AU - Kuo, Way

PY - 1984/6

Y1 - 1984/6

KW - Burn-in Weibull distribution

KW - Generalized Reduced Gradient (GRG) Method

KW - keywords

KW - Optimization

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UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0021443115&origin=recordpage

U2 - 10.1109/TR.1984.5221760

DO - 10.1109/TR.1984.5221760

M3 - RGC 21 - Publication in refereed journal

SN - 0018-9529

VL - R-33

SP - 145

EP - 156

JO - IEEE Transactions on Reliability

JF - IEEE Transactions on Reliability

IS - 2

ER -

Reliability Enhancement Through Optimal Burn-In

Research Keywords

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