Reliability enhancement of flash-memory storage systems: An efficient version-based design

Yuan-Hao Chang, Po-Chun Huang, Pei-Han Hsu, Lue-Jane Lee, Tei-Wei Kuo, David Hung-Chang Du

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

16 Citations (Scopus)

Abstract

In recent years, reliability has become one critical issue in the designs of flash-memory file/storage systems, due to the growing unreliability of advanced flash-memory chips. In this paper, a version-based design is proposed to effectively and efficiently maintain the consistency among page versions of a file for potential recovery needs. In particular, a two-version one for a native file system is presented with the minimal overheads in version maintenance. A recovery scheme is then presented to restore a corrupted file back to the latest consistent version. The design is later extended to maintain multiple data versions with the considerations of the write constraints of multilevel-cell flash memory. It was shown that the proposed design could significantly improve the reliability of flash memory with limited management and space overheads.
Original languageEnglish
Article number6212465
Pages (from-to)2503-2515
JournalIEEE Transactions on Computers
Volume62
Issue number12
Online published4 Jun 2012
DOIs
Publication statusPublished - Dec 2013
Externally publishedYes

Research Keywords

  • binomial distribution
  • ECC
  • file system
  • Flash memory
  • forward copying
  • MLC
  • Poisson distribution
  • queue
  • recovery
  • reliability
  • two version
  • YAFFS

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