TY - JOUR
T1 - RELIABILITY AND MAINTAINABILITY SYMPOSIUM, ANNUAL, PROCEEDINGS, 1973.
AU - Henricks, Earl D.
AU - Olsen, Alan K.
AU - Jacks, Herbert
AU - Ascher, Harold
AU - Brewerton, Francis J.
AU - Gober, R. Wayne
AU - Rice, Phillip
AU - Lieberman, Gerald J.
AU - McCool, John
AU - Proschan, Frank
AU - Grubbs, F.
AU - Schafer, R.
AU - Singpurwalla, N.
AU - Easterling, Robert
PY - 1973
Y1 - 1973
N2 - Following is the continuation of the list of titles and authors: Increase Reliability of Operational Systems (IROS). By Earl D. Hendricks and Alan K. Olsen. Logistics Effects on Operational Availability. By Herbert Jacks. Peril Rate/MTBF (t//1, t//2). By Harold Ascher. Reliability Data Plotting Using the Pearson Curves. By Francis J. Brewerton, R. Wayne Gober and Phillip Rice. Sampling PPrograms for Reliability. by Gerald J. Lieberman. Censored Sample Size Selection for Life Tests. By John McCool. Panel Discussion of Bayesian Analysis in Reliability. By Frank Proschan, F. Grubbs, R. Schafer and N. Singpurwalla. On the Use of Bayesian Methods in Reliability. By Robert Easterling.
AB - Following is the continuation of the list of titles and authors: Increase Reliability of Operational Systems (IROS). By Earl D. Hendricks and Alan K. Olsen. Logistics Effects on Operational Availability. By Herbert Jacks. Peril Rate/MTBF (t//1, t//2). By Harold Ascher. Reliability Data Plotting Using the Pearson Curves. By Francis J. Brewerton, R. Wayne Gober and Phillip Rice. Sampling PPrograms for Reliability. by Gerald J. Lieberman. Censored Sample Size Selection for Life Tests. By John McCool. Panel Discussion of Bayesian Analysis in Reliability. By Frank Proschan, F. Grubbs, R. Schafer and N. Singpurwalla. On the Use of Bayesian Methods in Reliability. By Robert Easterling.
UR - http://www.scopus.com/inward/record.url?scp=0015566968&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0015566968&origin=recordpage
M3 - RGC 21 - Publication in refereed journal
JO - Default journal
JF - Default journal
T2 - Reliab and Maintainability Symp, Annu, Proc, Jan 23-25 1973, 648 p, Sponsored by IEEE, ASQC, IES AIIE, AIAA, ASME
Y2 - 23 January 1973 through 25 January 1973
ER -