Abstract
The fabrication of multilayered SrtiO3/BaTiO3 thin films on LaNiO3-buffered Pt/Ti/SiO2/Si substrates were investigated by sol-gel deposition method. The microstructure and cyrstalline phase of the grown films were investigated by X-ray diffraction, transmission electron microscopy and X-ray photoelectron spectroscopy. The dielectric properties, as a function of multiplayer periodicity were investigated. The results show that the dielectric constants increased first and then decreased as the individual layer thickness increased.
© 2004 American Institute of Physics
| Original language | English |
|---|---|
| Pages (from-to) | 2026-2028 |
| Journal | Applied Physics Letters |
| Volume | 85 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 13 Sept 2004 |
Bibliographical note
Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].Funding
This research was supported by a CERG grant from the Hong Kong Research Grant Council (Project No. CityU 1049/02E). One of the authors (J.Z.) would like to acknowledge support from the Ministry of Sciences and Technology of China through 973-project under grant 2002CB613304 to complete some experiments, final data analysis, and the manuscript.
RGC Funding Information
- RGC-funded
Fingerprint
Dive into the research topics of 'Relaxor and nonlinear behaviors of SrTiO3/BaTiO3 multilayers derived by a sol-gel process'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver