Relation of refractive index to ti-concentration in near-stoichiometric Ti: LiNbO3 waveguide

De-Long Zhang; Fang Han; Shi-Yu Xu; Bei Chen; Ping-Rang Hua; Dao-Yin Yu; Edwin Yue-Bun Pun

doi:10.1109/LPT.2013.2272719

Relation of refractive index to ti-concentration in near-stoichiometric Ti: LiNbO₃ waveguide

De-Long Zhang, Fang Han, Shi-Yu Xu, Bei Chen, Ping-Rang Hua, Dao-Yin Yu, Edwin Yue-Bun Pun

Department of Electrical Engineering

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

5 Citations (Scopus)

Abstract

Multi-mode near-stoichiometric (NS) Ti:LiNbO₃ planar waveguide was fabricated by co-work of Li-rich vapor transport equilibration and in-diffusion of Ti-film on an initially congruent LiNbO₃ substrate. The Ti-concentration is profiled by secondary ion mass spectrometry. The refractive index profile is constructed from measured mode indices and correlated with the Ti-concentration profile. The results show that the index change and Ti-concentration follow an exponential relationship with a power index 0.75/0.49 for the ordinary/extraordinary ray. The relationship is different from that of either conventional congruent waveguide or homogeneously Ti-doped NS bulk material or NS waveguide fabricated by direct Ti-diffusion in an NS substrate. © 1989-2012 IEEE.

Original language	English
Article number	6557486
Pages (from-to)	1653-1655
Journal	IEEE Photonics Technology Letters
Volume	25
Issue number	17
DOIs	https://doi.org/10.1109/LPT.2013.2272719
Publication status	Published - 2013

Research Keywords

Near-stoichiometric Ti:LiNbO3 waveguide
Ti-concentration
Ti-induced refractive index change

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10.1109/LPT.2013.2272719

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Cite this

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title = "Relation of refractive index to ti-concentration in near-stoichiometric Ti: LiNbO3 waveguide",

abstract = "Multi-mode near-stoichiometric (NS) Ti:LiNbO3 planar waveguide was fabricated by co-work of Li-rich vapor transport equilibration and in-diffusion of Ti-film on an initially congruent LiNbO3 substrate. The Ti-concentration is profiled by secondary ion mass spectrometry. The refractive index profile is constructed from measured mode indices and correlated with the Ti-concentration profile. The results show that the index change and Ti-concentration follow an exponential relationship with a power index 0.75/0.49 for the ordinary/extraordinary ray. The relationship is different from that of either conventional congruent waveguide or homogeneously Ti-doped NS bulk material or NS waveguide fabricated by direct Ti-diffusion in an NS substrate. {\textcopyright} 1989-2012 IEEE.",

keywords = "Near-stoichiometric Ti:LiNbO3 waveguide, Ti-concentration, Ti-induced refractive index change",

author = "De-Long Zhang and Fang Han and Shi-Yu Xu and Bei Chen and Ping-Rang Hua and Dao-Yin Yu and Pun, {Edwin Yue-Bun}",

year = "2013",

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language = "English",

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TY - JOUR

T1 - Relation of refractive index to ti-concentration in near-stoichiometric Ti

T2 - LiNbO3 waveguide

AU - Zhang, De-Long

AU - Han, Fang

AU - Xu, Shi-Yu

AU - Chen, Bei

AU - Hua, Ping-Rang

AU - Yu, Dao-Yin

AU - Pun, Edwin Yue-Bun

PY - 2013

Y1 - 2013

N2 - Multi-mode near-stoichiometric (NS) Ti:LiNbO3 planar waveguide was fabricated by co-work of Li-rich vapor transport equilibration and in-diffusion of Ti-film on an initially congruent LiNbO3 substrate. The Ti-concentration is profiled by secondary ion mass spectrometry. The refractive index profile is constructed from measured mode indices and correlated with the Ti-concentration profile. The results show that the index change and Ti-concentration follow an exponential relationship with a power index 0.75/0.49 for the ordinary/extraordinary ray. The relationship is different from that of either conventional congruent waveguide or homogeneously Ti-doped NS bulk material or NS waveguide fabricated by direct Ti-diffusion in an NS substrate. © 1989-2012 IEEE.

AB - Multi-mode near-stoichiometric (NS) Ti:LiNbO3 planar waveguide was fabricated by co-work of Li-rich vapor transport equilibration and in-diffusion of Ti-film on an initially congruent LiNbO3 substrate. The Ti-concentration is profiled by secondary ion mass spectrometry. The refractive index profile is constructed from measured mode indices and correlated with the Ti-concentration profile. The results show that the index change and Ti-concentration follow an exponential relationship with a power index 0.75/0.49 for the ordinary/extraordinary ray. The relationship is different from that of either conventional congruent waveguide or homogeneously Ti-doped NS bulk material or NS waveguide fabricated by direct Ti-diffusion in an NS substrate. © 1989-2012 IEEE.

KW - Near-stoichiometric Ti:LiNbO3 waveguide

KW - Ti-concentration

KW - Ti-induced refractive index change

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