Rejoinder to 'stochastic modelling and analysis of degradation for highly reliable products'

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Overview

384 Scopus Citations

View graph of relations

Author(s)

Zhi-Sheng Ye
Min Xie

Detail(s)

Original language	English
Pages (from-to)	35-36
Journal / Publication	Applied Stochastic Models in Business and Industry
Volume	31
Issue number	1
Online published	25 Feb 2015
Publication status	Published - 2015

Link(s)

DOI	DOI https://doi.org/10.1002/asmb.2092 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-84923377854&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(138761bd-95da-48f9-a7af-df717d2dc9bd).html

Citation Format(s)

[ RIS ] [ BibTeX ]

Rejoinder to 'stochastic modelling and analysis of degradation for highly reliable products'. / Ye, Zhi-Sheng; Xie, Min.
In: Applied Stochastic Models in Business and Industry, Vol. 31, No. 1, 2015, p. 35-36.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Ye, Z-S & Xie, M 2015, 'Rejoinder to 'stochastic modelling and analysis of degradation for highly reliable products'', Applied Stochastic Models in Business and Industry, vol. 31, no. 1, pp. 35-36. https://doi.org/10.1002/asmb.2092

Ye, Z.-S., & Xie, M. (2015). Rejoinder to 'stochastic modelling and analysis of degradation for highly reliable products'. Applied Stochastic Models in Business and Industry, 31(1), 35-36. https://doi.org/10.1002/asmb.2092

Ye ZS, Xie M. Rejoinder to 'stochastic modelling and analysis of degradation for highly reliable products'. Applied Stochastic Models in Business and Industry. 2015;31(1):35-36. Epub 2015 Feb 25. doi: 10.1002/asmb.2092

Ye, Zhi-Sheng ; Xie, Min. / Rejoinder to 'stochastic modelling and analysis of degradation for highly reliable products'. In: Applied Stochastic Models in Business and Industry. 2015 ; Vol. 31, No. 1. pp. 35-36.