Abstract
We demonstrate with examples a technique of improving the accuracy of the inverse Wentzel-Kramers-Brillouin (WKB) method for refractive-index profiling of single-mode graded-index optical planar waveguides. © 2005 Society of Photo-Optical Instrumentation Engineers.
| Original language | English |
|---|---|
| Pages (from-to) | 1-4 |
| Journal | Optical Engineering |
| Volume | 44 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - May 2005 |
Research Keywords
- Graded-index waveguides
- Optical measurement
- Optical wave-guide characterization
- Refractive-index profiling
- Thin-film characterization
- Wentzel-Kramers-Brillouin method
Publisher's Copyright Statement
- COPYRIGHT TERMS OF DEPOSITED FINAL PUBLISHED VERSION FILE: Copyright © 2005 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited. Kin Seng Chiang and Chi Lai Wong "Refractive-index profiling of single-mode graded-index optical planar waveguides by the inverse Wentzel-Kramers-Brillouin method with improved accuracy," Optical Engineering 44(5), 054601 (1 May 2005). https://doi.org/10.1117/1.1907624.
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