Refractive index profile in titanium-diffused congruent lithium tantalate optical waveguide

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

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Author(s)

  • Xiao-Fei Yang
  • Chao-Yang Zhang
  • Zi-Bo Zhang
  • Wing-Han Wong
  • De-Long Zhang

Detail(s)

Original languageEnglish
Pages (from-to)181-184
Journal / PublicationMaterials Letters
Volume217
Early online date9 Jan 2018
Publication statusPublished - 15 Apr 2018

Abstract

Titanium-diffused lithium tantalate (Ti:LT) multimode planar waveguide was produced by in-diffusion of titanium thin-film deposited onto a Z-cut congruent LT substrate. Titanium concentration (CTi) in the titanium-diffused layer was profiled by secondary-ion-mass-spectrometry. Modes guided in the waveguide were characterized by prism coupling technique. Refractive index in the waveguide is profiled on the basis of the measured mode indices, and is related to the CTi profile. The results show that both the refractive index and the CTi profiles obey to a Gaussian function. The profiles of titanium-induced extraordinary and ordinary index changes are almost identical, implying that the index change in the Ti:LT waveguide has a small anisotropy and the confinement to the mode field is polarization-insensitive. The ordinary and extraordinary index changes reveal a similar exponential dependence on the CTi with a power index of ∼0.8.

Research Area(s)

  • Microstructure, Optical materials and properties, Surfaces

Citation Format(s)

Refractive index profile in titanium-diffused congruent lithium tantalate optical waveguide. / Yang, Xiao-Fei; Zhang, Chao-Yang; Zhang, Zi-Bo; Wong, Wing-Han; Yue-Bun Pun, Edwin; Zhang, De-Long.

In: Materials Letters, Vol. 217, 15.04.2018, p. 181-184.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review