Recrystallization and deformation texture components separation by high-energy x-ray diffraction
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 155-160 |
Journal / Publication | Materials Science Forum |
Volume | 408-412 |
Issue number | I |
Online published | Aug 2002 |
Publication status | Published - 2002 |
Externally published | Yes |
Conference
Title | Proceedings of the 13th International Conference on Textures of Materials |
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Place | Korea, Republic of |
City | Seoul |
Period | 26 - 30 August 2002 |
Link(s)
Abstract
A method to separate the recrystallization texture components from the deformation matrix in some partially recrystallized samples using monochromatic high-energy X-ray diffraction was presented. The validity of the method was demonstrated with partially recrystallized interstitial-free steel. The analysis showed that the X-ray scale intensity factors for the cold-rolled and annealed samples was about 26%, which was in agreement with the microstructures observed. © 2002 Trans Tech Publications Ltd, Switzerland
Research Area(s)
- Deformation, High-Energy X-Ray, Recrystallization, Synchrotron Radiation, Texture
Citation Format(s)
Recrystallization and deformation texture components separation by high-energy x-ray diffraction. / Wang, Y. D.; Wang, X. L.; Stoica, A. D. et al.
In: Materials Science Forum, Vol. 408-412, No. I, 2002, p. 155-160.
In: Materials Science Forum, Vol. 408-412, No. I, 2002, p. 155-160.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review