Recrystallization and deformation texture components separation by high-energy x-ray diffraction

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

  • Y. D. Wang
  • A. D. Stoica
  • J. D. Almer
  • U. Lienert
  • D. R. Haeffner
  • T. R. Watkins

Detail(s)

Original languageEnglish
Pages (from-to)155-160
Journal / PublicationMaterials Science Forum
Volume408-412
Issue numberI
Online publishedAug 2002
Publication statusPublished - 2002
Externally publishedYes

Conference

TitleProceedings of the 13th International Conference on Textures of Materials
PlaceKorea, Republic of
CitySeoul
Period26 - 30 August 2002

Abstract

A method to separate the recrystallization texture components from the deformation matrix in some partially recrystallized samples using monochromatic high-energy X-ray diffraction was presented. The validity of the method was demonstrated with partially recrystallized interstitial-free steel. The analysis showed that the X-ray scale intensity factors for the cold-rolled and annealed samples was about 26%, which was in agreement with the microstructures observed. © 2002 Trans Tech Publications Ltd, Switzerland

Research Area(s)

  • Deformation, High-Energy X-Ray, Recrystallization, Synchrotron Radiation, Texture

Citation Format(s)

Recrystallization and deformation texture components separation by high-energy x-ray diffraction. / Wang, Y. D.; Wang, X. L.; Stoica, A. D. et al.
In: Materials Science Forum, Vol. 408-412, No. I, 2002, p. 155-160.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review