Recent research advances in Pb-free solders

Yi-Shao Lai; Ho-Ming Tong; King-Ning Tu

doi:10.1016/j.microrel.2009.02.007

Recent research advances in Pb-free solders

Yi-Shao Lai^*
, Ho-Ming Tong
, King-Ning Tu

^*Corresponding author for this work

Research output: Journal Publications and Reviews › Editorial Preface

19 Citations (Scopus)

Original language	English
Pages (from-to)	221-222
Journal	Microelectronics Reliability
Volume	49
Issue number	3
Online published	26 Feb 2009
DOIs	https://doi.org/10.1016/j.microrel.2009.02.007
Publication status	Published - Mar 2009
Externally published	Yes

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Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

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title = "Recent research advances in Pb-free solders",

author = "Yi-Shao Lai and Ho-Ming Tong and King-Ning Tu",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].",

year = "2009",

month = mar,

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volume = "49",

pages = "221--222",

journal = "Microelectronics Reliability",

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TY - JOUR

T1 - Recent research advances in Pb-free solders

AU - Lai, Yi-Shao

AU - Tong, Ho-Ming

AU - Tu, King-Ning

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2009/3

Y1 - 2009/3

UR - https://www.scopus.com/pages/publications/61349195113

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-61349195113&origin=recordpage

U2 - 10.1016/j.microrel.2009.02.007

DO - 10.1016/j.microrel.2009.02.007

M3 - Editorial Preface

SN - 0026-2714

VL - 49

SP - 221

EP - 222

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 3

ER -

Recent research advances in Pb-free solders

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