Recall test for keyboard layout

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)

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Author(s)

Detail(s)

Original languageEnglish
Title of host publicationLecture Notes in Engineering and Computer Science
PublisherNewswood Limited
Pages822-827
Volume2
ISBN (Print)9789881404763
Publication statusPublished - 2016

Publication series

Name
Volume2
ISSN (Print)2078-0958

Conference

TitleInternational Multiconference of Engineers and Computer Scientists 2016, IMECS 2016
PlaceHong Kong
CityTsimshatsui, Kowloon
Period16 - 18 March 2016

Abstract

In this study, the recall accuracies for different keys on a keyboard were studied and analyzed in a systematic way. It was found that alphabetic keys in the area of "Typing Keys" resulted in relatively lower recall accuracies than "Function Keys", "Control Keys" and "Numeric Keys". Besides, there was an absence of significant association between the relative use frequency of English letters and their recall accuracies, confirming to the general expectation that typing tasks rely on the processing of implicit memory rather than explicit memory. Regarding the recall accuracies for numeric keys, participants had higher recall accuracy for the keys located in "Numeric Keypad" than those in the "Typing Key" area. This might be the result of experience transfer from their daily interaction with devices of similar layout (ATM). Some useful suggestions were provided for the design of a more user-friendly keyboard layout.

Research Area(s)

  • Explicit memory, Keyboard layout, Muscle memory, Recall accuracy, Typing performance

Citation Format(s)

Recall test for keyboard layout. / Stefanie, X.Q. Kang; Tsang, Steve N.H.; Chan, Alan H.S.; Liu, S. L.

Lecture Notes in Engineering and Computer Science. Vol. 2 Newswood Limited, 2016. p. 822-827.

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)