Real time analysis of magnetron-sputtered thin-film CdTe by multichannel spectroscopic ellipsometry

Jian Li; Jie Chen; J. A. Zapien; N. J. Podraza; Chi Chen; J. Drayton; A. Vasko; A. Gupta; S. L. Wang; R. W. Collins; A. D. Compaan

Real time analysis of magnetron-sputtered thin-film CdTe by multichannel spectroscopic ellipsometry

Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 22_Publication in policy or professional journal

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Engineering & Materials Science

100

Spectroscopic ellip... Engineering & Materials S...

Substrates Engineering & Materials S...

Thin films Engineering & Materials S...

Nucleation Engineering & Materials S...

Microstructure Engineering & Materials S...

Deposition rates Engineering & Materials S...

Coalescence Engineering & Materials S...

Optical properties Engineering & Materials S...

Modulation Engineering & Materials S...

Crystalline materia... Engineering & Materials S...

Temperature Engineering & Materials S...

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