Rb_xK_1-xTiOPO₄ thin films grown on KTiOPO₄ substrates by liquid phase epitaxy

The properties of Rb_xK_1-xTiOPO₄ thin films grown on KTiOPO₄ substrates are reported. High quality films were obtained using the flux liquid phase epitaxy method, and optical waveguiding was observed in these epitaxial films. X-ray analysis shows that the epitaxial films are single crystals films. Their cell constants are different from those of the substrates. The epitaxy growth rate and other film properties were compared for films grown on different faces. Two different surface morphologies were observed for films grown on (100) faces. The morphologies on (201) and (201) faces were also different. The quality of films grown on the (201) face was better. The reason for a structure inversion for films grown on the z^- face is discussed.