Radiation induced nanovoid shrinkage in Cu at room temperature: An in situ study

C. Fan, A. R.G. Sreekar, Z. Shang, Jin Li, M. Li, H. Wang, A. El-Azab, X. Zhang

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

14 Citations (Scopus)

Abstract

Radiation induced void swelling is widely observed in a variety of metallic materials. Here, by using sputtering deposition technique, we have introduced faceted nanovoids into Cu films. In-situ Kr ion irradiation was subsequently performed at room temperature to investigate the evolution of nanovoids. Most nanovoids found to shrink gradually with increasing dose. Irradiation induced high-density vacancy clusters exist mostly in the form of stacking fault tetrahedrons. Phase field modeling reveales that void shrinkage arises from biased absorption of interstitials. These findings provide insights to the physical mechanisms of radiation response of nanovoids in metallic materials.
Original languageEnglish
Pages (from-to)112-116
JournalScripta Materialia
Volume166
DOIs
Publication statusPublished - 1 Jun 2019
Externally publishedYes

Bibliographical note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Research Keywords

  • In situ radiation
  • Nanovoids
  • Phase-field modeling
  • Stacking fault tetrahedron
  • Void shrinkage

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