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Quality-Relevant Monitoring and Diagnosis with Dynamic Concurrent Projection to Latent Structures

  • Qiang Liu
  • , S. Joe Qin
  • , Tianyou Chai

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

In this paper, a data-driven dynamic concurrent projection to latent structures (DCPLS) approach is proposed for quality-relevant fault diagnosis of dynamic processes. First, a novel DCPLS algorithm is proposed for dynamic modeling which captures the dynamic correlations between quality variables and process variables. Quality-specific variations, process-specific variations, and quality-process covariations of dynamic processes are monitored respectively. Secondly, a multi-block extension of DCPLS is designed to compute the contributions according to block partition of the lagged variables, in order to help localize faults. Finally, the application results on strip-thickness relevant fault diagnosis for a practical cold rolling continuous annealing process (CAP) demonstrate the effectiveness of the proposed methods.
Original languageEnglish
Title of host publicationProceedings of the 19th World Congress The International Federation of Automatic Control
EditorsEdward Boje, Xiaohua Xia
PublisherInternational Federation of Automatic Control (IFAC)
Pages2740-2745
ISBN (Print)978-3-902823-62-5
DOIs
Publication statusPublished - Aug 2014
Externally publishedYes
Event19th IFAC World Congress on International Federation of Automatic Control, IFAC 2014 - Cape Town, South Africa
Duration: 24 Aug 201429 Aug 2014
https://www.sciencedirect.com/journal/ifac-proceedings-volumes/vol/47/issue/3

Publication series

NameIFAC Proceedings Volumes (IFAC-PapersOnline)
ISSN (Print)1474-6670

Conference

Conference19th IFAC World Congress on International Federation of Automatic Control, IFAC 2014
PlaceSouth Africa
CityCape Town
Period24/08/1429/08/14
Internet address

Research Keywords

  • Dynamic concurrent projection to latent structures
  • Dynamic process modeling
  • Fault diagnosis

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