PWL: A progressive wear leveling to minimize data migration overheads for NAND flash devices

Fu-Hsin Chen, Ming-Chang Yang, Yuan-Hao Chang, Tei-Wei Kuo

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

25 Citations (Scopus)

Abstract

As the endurance of flash memory keeps deteriorating, exploiting wear leveling techniques to improve the lifetime/endurance of flash memory has become a critical issue in the design of flash storage devices. In contrast to existing wear-leveling techniques that aggressively distributes the erases to all flash blocks by a fixed threshold, we propose a progressive wear leveling design to perform wear leveling in a 'progressive' way to prevent any block from being worn out prematurely, and thereby to ultimately minimize the performance overheads caused by the unnecessary data migration. The results reveal that, instead of sacrificing the device lifetime, performing wear leveling in such a progressive way can not only minimize the performance overheads but even have potentials to extend the device lifespan.
Original languageEnglish
Title of host publicationProceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition (DATE)
PublisherIEEE
Pages1209-1212
ISBN (Electronic)978-3-9815-3705-5
ISBN (Print)978-3-9815-3704-8
DOIs
Publication statusPublished - Mar 2015
Externally publishedYes
Event2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 - Grenoble, France
Duration: 9 Mar 201513 Mar 2015
http://www.date-conference.com
http://www.date-conference.com (unknown)
http://www.date-conference.com (unknown)
http://www.date-conference.com (unknown)

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
Volume2015-April
ISSN (Print)1530-1591

Conference

Conference2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
Country/TerritoryFrance
CityGrenoble
Period9/03/1513/03/15
Internet address

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