APPROXIMATE MAXIMUM-LIKELIHOOD DELAY ESTIMATION VIA ORTHOGONAL WAVELET TRANSFORM
Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN)
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
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Title of host publication | Proceedings of 1997 IEEE International Symposium on Circuits and Systems |
Subtitle of host publication | Circuits and Systems in the Information Age |
Publisher | IEEE |
Pages | 2501-2504 |
Volume | 4 |
ISBN (Electronic) | 0780335864 |
ISBN (Print) | 078033583X, 0780335848 |
Publication status | Published - Jun 1997 |
Publication series
Name | Proceedings - IEEE International Symposium on Circuits and Systems |
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Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISSN (Print) | 0271-4310 |
Conference
Title | 1997 IEEE International Symposium on Circuits and Systems (ISCAS '97) |
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Place | China |
City | Hong Kong |
Period | 9 - 12 June 1997 |
Link(s)
Abstract
A novel approximate maximum likelihood algorithm is proposed for estimating the time difference of arrival between signals received at two spatially separated sensors. Prior to cross correlation, one of the channel outputs is optimally weighted at different frequency bands with the use of an orthogonal wavelet decomposition. It can be viewed as a time domain implementation of the generalized cross correlation method. However, it does not suffer from the performance degradation due to the errors inherent in spectral estimation obtained from finite length data and is computationally efficient. Simulation results show that the proposed method out-performs direct cross correlation particularly when the noise level is high.
Citation Format(s)
APPROXIMATE MAXIMUM-LIKELIHOOD DELAY ESTIMATION VIA ORTHOGONAL WAVELET TRANSFORM. / Chan, Y. T.; So, H. C.; Ching, P. C.
Proceedings of 1997 IEEE International Symposium on Circuits and Systems: Circuits and Systems in the Information Age. Vol. 4 IEEE, 1997. p. 2501-2504 (Proceedings - IEEE International Symposium on Circuits and Systems).Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN)