Evaluating the quality of reference models

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)

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Author(s)

Detail(s)

Original languageEnglish
Title of host publicationConceptual Modeling - ER 2000
Subtitle of host publication19th International Conference on Conceptual Modeling, Proceedings
EditorsVeda C. Storey, Stephen W. Liddle, Aberto H.F. Laender
PublisherSpringer Verlag
Pages484-498
Volume1920
ISBN (Print)9783540410720
StatePublished - 2000
Externally publishedYes

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume1920
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Title19th International Conference on Conceptual Modeling, ER 2000
PlaceUnited States
CitySalt Lake City
Period9 - 12 October 2000

Abstract

The process of system design often begins with the selection of an appropriate reference model. Model selection necessitates a good understanding of the system to be developed, as well as of the reference models available for that particular type of systems. In this paper, we propose a conceptual framework for comparing reference models, based on an elaboration of a linguistics-based classification approach. This framework is applied to the comparative analysis of two well known reference models for electronic commerce.

Citation Format(s)

Evaluating the quality of reference models. / Mišić, Vojislav B.; Zhao, J. Leon.

Conceptual Modeling - ER 2000: 19th International Conference on Conceptual Modeling, Proceedings. ed. / Veda C. Storey; Stephen W. Liddle; Aberto H.F. Laender. Vol. 1920 Springer Verlag, 2000. p. 484-498 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 1920).

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)