Robustness of various production control policies in semiconductor manufacturing

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

10 Scopus Citations
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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)171-182
Journal / PublicationProduction and Operations Management
Volume9
Issue number2
Publication statusPublished - Jun 2000
Externally publishedYes

Abstract

This paper compares several different production control policies in terms of their robustness to random disturbances such as machine failures, demand fluctuations, and system parameter changes. Simulation models based on VLSI wafer fabrication facilities are utilized to test the performance of the policies. Three different criteria, namely, the average total WIP, the average backlog, and a cost function combining these measures, are used to evaluate performance. Among the policies tested, the Two-Boundary Control policy outperforms the others.

Research Area(s)

  • Kanban, Push and pull production policies, Re-entrant shop, Simulation, Two-boundary control

Citation Format(s)

Robustness of various production control policies in semiconductor manufacturing. / Yan, Houmin; Lou, Sheldon; Sethi, Suresh P.

In: Production and Operations Management, Vol. 9, No. 2, 06.2000, p. 171-182.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review