Robustness of various production control policies in semiconductor manufacturing
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
| Original language | English |
|---|---|
| Pages (from-to) | 171-182 |
| Journal / Publication | Production and Operations Management |
| Volume | 9 |
| Issue number | 2 |
| Publication status | Published - Jun 2000 |
| Externally published | Yes |
Link(s)
Abstract
This paper compares several different production control policies in terms of their robustness to random disturbances such as machine failures, demand fluctuations, and system parameter changes. Simulation models based on VLSI wafer fabrication facilities are utilized to test the performance of the policies. Three different criteria, namely, the average total WIP, the average backlog, and a cost function combining these measures, are used to evaluate performance. Among the policies tested, the Two-Boundary Control policy outperforms the others.
Research Area(s)
- Kanban, Push and pull production policies, Re-entrant shop, Simulation, Two-boundary control
Citation Format(s)
Robustness of various production control policies in semiconductor manufacturing. / Yan, Houmin; Lou, Sheldon; Sethi, Suresh P.
In: Production and Operations Management, Vol. 9, No. 2, 06.2000, p. 171-182.
In: Production and Operations Management, Vol. 9, No. 2, 06.2000, p. 171-182.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
