A THz measurement platform design for 0.2-1.1THz
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
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Title of host publication | IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves |
Publisher | Institute of Electrical and Electronics Engineers, Inc. |
ISBN (print) | 9781479982721 |
Publication status | Published - 11 Nov 2015 |
Conference
Title | 40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015 |
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Place | China |
City | Hong Kong |
Period | 23 - 28 August 2015 |
Link(s)
Abstract
A precise and stable THz Measurement Platform is proposed in this paper. The displacement precision and angle precision of the platform are 0.02mm and 1° respectively. With OML or VDI extension module and Agilent N5245A PNA-X network analyzer, the THz Measurement Platform can measure waveguide components and antennas precisely in 0.2-1.1THz.
Citation Format(s)
A THz measurement platform design for 0.2-1.1THz. / Zhu, Haotian; Xue, Quan.
IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves. Institute of Electrical and Electronics Engineers, Inc., 2015. 7327432.
IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves. Institute of Electrical and Electronics Engineers, Inc., 2015. 7327432.
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review