Impact on Human Exposure to Low Frequency Radiation with Psychological and Brainwave changes
Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN)
Author(s)
Related Research Unit(s)
Detail(s)
| Original language | English |
|---|---|
| Title of host publication | 2018 IEEE International Symposium on Electromagnetic Compatibility & 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) |
| Publisher | IEEE |
| Pages | 936-939 |
| ISBN (Electronic) | 9781509059973, 9781509059966 |
| ISBN (Print) | 9781509039555 |
| Publication status | Published - May 2018 |
Conference
| Title | 60th IEEE International Symposium on Electromagnetic Compatibility (IEEE EMC 2018) |
|---|---|
| Place | Singapore |
| Period | 14 - 17 May 2018 |
Link(s)
Abstract
This study investigates the impact of exposure to low frequency (LF) radiation with psychological and brainwave changes. 22 subjects under a 100kHz and 0.5A/m magnetic exposure were investigated; the psychological status of the subjects was evaluated by Positive and Negative Affect Schedule (PANAS); their Electroencephalographs (EEGs) of the sham exposure and the control exposure were recorded. Outcomes of the experiment are correlated for the psychological changes and brainwave activity of human exposure. Statistical outcomes have indicated that the acute LF exposure will induce psychological changes but there were no significant brain wave changes. The significance level of the statistical outcomes of both psychological responses and the brain wave activity were confirmed with a pair t -test.
Research Area(s)
- Brian wave, Low frequency, Psychological changes
Citation Format(s)
Impact on Human Exposure to Low Frequency Radiation with Psychological and Brainwave changes . / HE, Yaqing; SUN, Weinong; LEUNG, Peter S. W.; SIU, Timothy Y M; NG, K T.
2018 IEEE International Symposium on Electromagnetic Compatibility & 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC). IEEE, 2018. p. 936-939.Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN)
