Refractive index profile in photorefractive-damage-resistant near-stoichiometric Ti:Mg:Er : LiNbO 3 strip waveguide
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
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Article number | 6297432 |
Pages (from-to) | 1823-1830 |
Journal / Publication | IEEE Photonics Journal |
Volume | 4 |
Issue number | 5 |
Publication status | Published - 2012 |
Link(s)
DOI | DOI |
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Attachment(s) | Documents
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Link to Scopus | https://www.scopus.com/record/display.uri?eid=2-s2.0-84866877917&origin=recordpage |
Permanent Link | https://scholars.cityu.edu.hk/en/publications/publication(c0277cca-54f8-40d2-8588-a66afd585e2c).html |
Abstract
Refractive index profile in photorefractive-damage-resistant near-stoichiometric (NS) single-mode Ti:Mg:Er: LiNbO 3 strip waveguide is constructed from the measured mode field distribution. Like the conventional congruent Ti:LiNbO 3 waveguide, the Ti-induced refractive index increase in the NS waveguide studied here follows a sum of two error functions in the width direction and a Gaussian function in the depth direction. Based upon the established index profile model, the mode sizes were calculated using the variational method and compared with the experimental results. The Ti-induced index increment at the NS waveguide surface was also evaluated according to the empirical relation previously reported for the conventional congruent Ti: LiNbO 3 waveguide and compared with the data deduced from the mode field distribution. All comparisons show good agreement, showing that the index model proposed is close to the practical scenario. © 2009-2012 IEEE.
Research Area(s)
- mode field distribution, Near-stoichiometric (NS) Ti:Mg:Er:LiNbO 3 waveguide, refractive index profile, variational method
Citation Format(s)
Refractive index profile in photorefractive-damage-resistant near-stoichiometric Ti:Mg:Er: LiNbO 3 strip waveguide. / Xu, Shi-Yu; Chen, Bei; Hua, Ping-Rang et al.
In: IEEE Photonics Journal, Vol. 4, No. 5, 6297432, 2012, p. 1823-1830.
In: IEEE Photonics Journal, Vol. 4, No. 5, 6297432, 2012, p. 1823-1830.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
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