Analysis and Equivalent-Circuit Model for CMOS On-Chip Multiple Coupled Inductors in the Millimeter-Wave Region
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
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Article number | 7312452 |
Pages (from-to) | 3957-3964 |
Journal / Publication | IEEE Transactions on Electron Devices |
Volume | 62 |
Issue number | 12 |
Publication status | Published - 1 Dec 2015 |
Link(s)
Abstract
A growing number of on-chip inductors have been applied in the millimeter-wave IC design. The coupling effects between them have a negative impact on the performance of the circuit and each on-chip inductor. In this paper, a new equivalent-circuit model and a parameter extraction method for multiple on-chip inductors in the millimeter-wave region are proposed. The impacts of coupling effects on every on-chip inductor are comprehensive considered in the proposed parameter extraction method. The characteristics of the multiple on-chip-coupled inductors are analyzed, modeled, and measured. The test structures were fabricated by 0.18-μ m and 90-nm CMOS processes. The inductances, quality factors, and S-parameters of the model agree well with the measured performance of on-chip-nested and side-by-side-coupled inductors over a wide frequency range from 10 MHz up to millimeter-wave frequency band.
Research Area(s)
- CMOS, equivalent-circuit model, millimeter wave, multiple coupled inductors, nested coupled inductors.
Citation Format(s)
Analysis and Equivalent-Circuit Model for CMOS On-Chip Multiple Coupled Inductors in the Millimeter-Wave Region. / Gao, Zongzhi; Kang, Kai; Jiang, Zhengdong et al.
In: IEEE Transactions on Electron Devices, Vol. 62, No. 12, 7312452, 01.12.2015, p. 3957-3964.
In: IEEE Transactions on Electron Devices, Vol. 62, No. 12, 7312452, 01.12.2015, p. 3957-3964.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review