Relation of refractive index to ti-concentration in near-stoichiometric Ti : LiNbO3 waveguide

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

  • De-Long Zhang
  • Fang Han
  • Shi-Yu Xu
  • Bei Chen
  • Ping-Rang Hua
  • Dao-Yin Yu

Related Research Unit(s)

Detail(s)

Original languageEnglish
Article number6557486
Pages (from-to)1653-1655
Journal / PublicationIEEE Photonics Technology Letters
Volume25
Issue number17
Publication statusPublished - 2013

Abstract

Multi-mode near-stoichiometric (NS) Ti:LiNbO3 planar waveguide was fabricated by co-work of Li-rich vapor transport equilibration and in-diffusion of Ti-film on an initially congruent LiNbO3 substrate. The Ti-concentration is profiled by secondary ion mass spectrometry. The refractive index profile is constructed from measured mode indices and correlated with the Ti-concentration profile. The results show that the index change and Ti-concentration follow an exponential relationship with a power index 0.75/0.49 for the ordinary/extraordinary ray. The relationship is different from that of either conventional congruent waveguide or homogeneously Ti-doped NS bulk material or NS waveguide fabricated by direct Ti-diffusion in an NS substrate. © 1989-2012 IEEE.

Research Area(s)

  • Near-stoichiometric Ti:LiNbO3 waveguide, Ti-concentration, Ti-induced refractive index change

Citation Format(s)

Relation of refractive index to ti-concentration in near-stoichiometric Ti: LiNbO3 waveguide. / Zhang, De-Long; Han, Fang; Xu, Shi-Yu et al.
In: IEEE Photonics Technology Letters, Vol. 25, No. 17, 6557486, 2013, p. 1653-1655.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review