機器學習算法實現亞衍射極限的納米尺度光學顯微圖像轉換爲大視場掃描電子顯微鏡質素圖像方法
Research output: Patents, Agreements and Assignments (RGC: 51, 52) › 51_Patents (CityU)
Author(s)
Related Research Unit(s)
Detail(s)
| Original language | Chinese (Traditional) |
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| Filing number | 202211041006.4 |
| Publication status |
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Link(s)
| Permanent Link | https://scholars.cityu.edu.hk/en/publications/publication(ad6afcf1-4fe4-4ebc-b67f-a742ba1e2bb9).html |
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Citation Format(s)
機器學習算法實現亞衍射極限的納米尺度光學顯微圖像轉換爲大視場掃描電子顯微鏡質素圖像方法. / SUN, Hui (Inventor); CHEN, Meng (Inventor); LI, Wen Jung (Inventor) et al.
Aug 29, 2022.
Aug 29, 2022.
Research output: Patents, Agreements and Assignments (RGC: 51, 52) › 51_Patents (CityU)
